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Failure analysis single item detection

Auger electron spectroscopy analysis(AES)

 

X ray analysis (X-ray)

 

Cross section &Microscope (Metallographic)

 

SEM and EDS analysis (SEM&EDS)

 

Laser confocal Raman microspectroscopy (Micro Raman spectroscopy)

 

X ray diffraction analysis(XRD)

 

Micro Fourier transform infrared spectroscopy (FTIR)

 

Acoustic scanning analysis(C-SAM)

 

Transmission electron microscope(TEM)

 

X-ray fluorescence spectrometric analysis(XRF)

 

Staining analysis (Staining)

 

 

Inductively coupled plasma atomic emission spectrometry (ICP-OES)X-RAY perspective microscopeGas chromatography-mass spectrometry GC-MS
Scanning electron microscope and energy dispersive spectrometer SEM/EDSAcoustic scanning microscope SAMTransmission electron microscope TEM